Gossner, M. : rechercher sur Z-Library

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1

Management of Postpartum Hemorrhage

Menzies, Anya V., Poljak, Dijana, Pearl, Michael Loran, Gossner, Gabrielle, Griffin, Todd R., Burke, William M.

Journal:

Obstetrics & Gynecology

Année:

2019

Fichier:

PDF, 86 KB

2019

2

Reliability aspects of gate oxide under ESD pulse stress

Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran Chatty, Robert Gauthier, Alain Bravaix

Journal:

Microelectronics Reliability

Année:

2009

Langue:

english

Fichier:

PDF, 1.38 MB

english, 2009

3

Technical progress and energy dependent production functions

Reiner Kümmel, Wolfgang Strassl, Alfred Gossner, Wolfgang Eichhorn

Journal:

Journal of Economics

Année:

1985

Langue:

english

Fichier:

PDF, 1.35 MB

english, 1985

4

Entropy and the Value of Information for Investors

Cabrales, Antonio, Gossner, Olivier, Serrano, Roberto

Journal:

American Economic Review

Année:

2013

Langue:

english

Fichier:

PDF, 524 KB

english, 2013

5

Daly and Doyen's Introduction to Insect Biology and Diversity. 3rd ed.--James B. Whitfield and Alexander H. Purcell III.

Journal:

Systematic Biology

Année:

2013

Langue:

english

Fichier:

PDF, 231 KB

english, 2013

6

RF ESD protection strategies: Codesign vs. low-C protection

W. Soldner, M. Streibl, U. Hodel, M. Tiebout, H. Gossner, D. Schmitt-Landsiedel, J.H. Chun, C. Ito, R.W. Dutton

Journal:

Microelectronics Reliability

Année:

2007

Langue:

english

Fichier:

PDF, 1.02 MB

english, 2007

7

Dangerous parasitics of socketed CDM ESD testers

H. Gossner, T. Brodbeck

Journal:

Microelectronics Reliability

Année:

1997

Langue:

english

Fichier:

PDF, 283 KB

english, 1997

8

INFORMATIONAL CASCADES ELICIT PRIVATE INFORMATION

Olivier Gossner, Nicolas Melissas

Journal:

International Economic Review

Année:

2006

Langue:

english

Fichier:

PDF, 286 KB

english, 2006

9

N2O-Producing Microorganisms in the Gut of the Earthworm Aporrectodea caliginosa Are Indicative of Ingested Soil Bacteria

Ihssen, J., Horn, M. A., Matthies, C., Gossner, A., Schramm, A., Drake, H. L.

Journal:

Applied and Environmental Microbiology

Année:

2003

Langue:

english

Fichier:

PDF, 117 KB

english, 2003

10

[IEEE 31st European Solid-State Device Research Conference - Nuremberg, Germany (2001.9.11-2001.9.13)] 31st European Solid-State Device Research Conference - Influence of Layout Parameters on Triggering Behavior in 0.35um and 0.18um Process gg-nMOS ESD Protection Devices

Litzenberger, M., Pichler, R., Pogany, D., Gornik, E., Esmark, K., Gossner, H.

Année:

2001

Fichier:

PDF, 250 KB

2001

11

Part I: High-Voltage MOS Device Design for Improved Static and RF Performance

Gupta, Ankur, Shrivastava, Mayank, Baghini, Maryam Shojaei, Sharma, Dinesh Kumar, Gossner, Harald, Rao, V. Ramgopal

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.87 MB

english, 2015

12

[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Contact and junction engineering in bulk FinFET technology for improved ESD/latch-up performance with design trade-offs and its implications on hot carrier reliability

Paul, Milova, Kumar, B. Sampath, Gossner, Harald, Shrivastava, Mayank

Année:

2018

Langue:

english

Fichier:

PDF, 551 KB

english, 2018

13

Cross-scale effects of land use on the functional composition of herbivorous insect communities

Neff, Felix, Blüthgen, Nico, Chisté, Melanie N., Simons, Nadja K., Steckel, Juliane, Weisser, Wolfgang W., Westphal, Catrin, Pellissier, Loïc, Gossner, Martin M.

Journal:

Landscape Ecology

Année:

2019

Langue:

english

Fichier:

PDF, 625 KB

english, 2019

14

Do ESD fails in systems correlate with IC ESD robustness?

Wolfgang Stadler, Tilo Brodbeck, Reinhold Gärtner, Harald Gossner

Journal:

Microelectronics Reliability

Année:

2009

Langue:

english

Fichier:

PDF, 433 KB

english, 2009

15

Bulk and surface degradation mode in 0.35μm technology gg-nMOS ESD protection devices

D Pogany, K Esmark, M Litzenberger, C Fürböck, H Gossner, E Gornik

Journal:

Microelectronics Reliability

Année:

2000

Langue:

english

Fichier:

PDF, 478 KB

english, 2000

16

Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices

M. Litzenberger, R. Pichler, S. Bychikhin, D. Pogany, E. Gornik, K. Esmark, H. Gossner

Journal:

Microelectronics Reliability

Année:

2001

Fichier:

PDF, 387 KB

2001

17

Silicon nanoelectronic devices with delta-doped layers

F. Wittmann, H. Gossner, I. Eisele

Journal:

Journal of Materials Science: Materials in Electronics

Année:

1995

Langue:

english

Fichier:

PDF, 679 KB

english, 1995

18

Study of triggering inhomogeneities in gg-nMOS ESD protection devices via thermal mapping using backside laser interferometry

M. Litzenberger, K. Esmark, D. Pogany, C. Fürböck, H. Gossner, E. Gornik, W. Fichtner

Journal:

Microelectronics Reliability

Année:

2000

Langue:

english

Fichier:

PDF, 496 KB

english, 2000

19

Damage analysis in smart-power technology electrostatic discharge (ESD) protection devices

D. Pogany, N. Seliger, M. Litzenberger, H. Gossner, M. Stecher, T. Müller-Lynch, W. Werner, E. Gornik

Journal:

Microelectronics Reliability

Année:

1999

Langue:

english

Fichier:

PDF, 437 KB

english, 1999

20

Characterization and Optimization of Sub-32-nm FinFET Devices for ESD Applications

Thijs, S., Tremouilles, D., Russ, C., Griffoni, A., Collaert, N., Rooyackers, R., Linten, D., Scholz, M., Duvvury, C., Gossner, H., Jurczak, M., Groeseneken, G.

Journal:

IEEE Transactions on Electron Devices

Année:

2008

Langue:

english

Fichier:

PDF, 482 KB

english, 2008

21

Part I: Mixed-Signal Performance of Various High-Voltage Drain-Extended MOS Devices

Shrivastava, M., Baghini, M.S., Gossner, H., Rao, V.R.

Journal:

IEEE Transactions on Electron Devices

Année:

2010

Langue:

english

Fichier:

PDF, 1.14 MB

english, 2010

22

Saproxylic beetles as indicator species for dead-wood amount and temperature in European beech forests

Thibault Lachat, Beat Wermelinger, Martin M. Gossner, Heinz Bussler, Gunnar Isacsson, Jörg Müller

Journal:

Ecological Indicators

Année:

2012

Langue:

english

Fichier:

PDF, 535 KB

english, 2012

23

A Review on the ESD Robustness of Drain-Extended MOS Devices

Shrivastava, M., Gossner, H.

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2012

Langue:

english

Fichier:

PDF, 2.40 MB

english, 2012

24

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Impact of Strain on ESD Robustness of FinFET Devices

Griffoni, A., Thijs, S., Russ, C., Tremouilles, D., Scholz, M., Linten, D., Collaert, N., Rooyackers, R., Duvvury, C., Gossner, H., Meneghesso, G., Groeseneken, G.

Année:

2008

Langue:

english

Fichier:

PDF, 378 KB

english, 2008

25

Vertical Si-Metal-Oxide-Semiconductor Field Effect Transistors with Channel Lengths of 50 nm by Molecular Beam Epitaxy

Gossner, Harald, Eisele, Ignaz, Risch, Lothar

Journal:

Japanese Journal of Applied Physics

Année:

1994

Fichier:

PDF, 968 KB

1994

26

[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Understanding the optimization of sub-45nm FinFET devices for ESD applications

Tremouilles, D., Thijs, S., Russ, C., Schneider, J., Duvvury, C., Collaert, N., Linten, D., Scholz, M., Jurczak, M., Gossner, H., Groeseneken, G.

Année:

2007

Langue:

english

Fichier:

PDF, 1001 KB

english, 2007

27

Part II: A Fully Integrated RF PA in 28-nm CMOS With Device Design for Optimized Performance and ESD Robustness

Gupta, Ankur, Shrivastava, Mayank, Baghini, Maryam Shojaei, Chandorkar, A. N., Gossner, Harald, Rao, V. Ramgopal

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 2.65 MB

english, 2015

28

A review on plant diversity and forest management of European beech forests

Schulze, E. D., Aas, G., Grimm, G. W., Gossner, M. M., Walentowski, H., Ammer, C., Kühn, I., Bouriaud, O., von Gadow, K.

Journal:

European Journal of Forest Research

Année:

2016

Langue:

english

Fichier:

PDF, 1.66 MB

english, 2016

29

Entropy and the Value of Information for Investors

Antonio Cabrales, Olivier Gossner and Roberto Serrano

Journal:

American Economic Review

Année:

2013

Langue:

english

Fichier:

PDF, 1.47 MB

english, 2013

30

Biodiversity at multiple trophic levels is needed for ecosystem multifunctionality

Soliveres, Santiago, van der Plas, Fons, Manning, Peter, Prati, Daniel, Gossner, Martin M., Renner, Swen C., Alt, Fabian, Arndt, Hartmut, Baumgartner, Vanessa, Binkenstein, Julia, Birkhofer, Klaus, Bl

Journal:

Année:

2016

Langue:

english

Fichier:

PDF, 5.01 MB

english, 2016

31

System Level ESD Co-Design (Duvvury/System Level ESD Co-Design) || Hard Failures and PCB Protection Devices

Duvvury, Charvaka, Gossner, Harald

Année:

2015

Langue:

english

Fichier:

PDF, 3.09 MB

english, 2015

32

Land-use intensification causes multitrophic homogenization of grassland communities

Gossner, Martin M., Lewinsohn, Thomas M., Kahl, Tiemo, Grassein, Fabrice, Boch, Steffen, Prati, Daniel, Birkhofer, Klaus, Renner, Swen C., Sikorski, Johannes, Wubet, Tesfaye, Arndt, Hartmut, Baumgartn

Journal:

Année:

2016

Langue:

english

Fichier:

PDF, 17.33 MB

english, 2016

33

System Level ESD Co-Design (Duvvury/System Level ESD Co-Design) || Soft Failure Mechanisms and PCB Design Measures

Duvvury, Charvaka, Gossner, Harald

Année:

2015

Langue:

english

Fichier:

PDF, 4.84 MB

english, 2015

34

[IEEE 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Tucson, AZ, USA (2017.9.10-2017.9.14)] 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - FinFET SCR: Design challenges and novel fin SCR approaches for on-chip ESD protection

Paul, Milova, Kumar, B. Sampath, Russ, Christian, Gossner, Harald, Shrivastava, Mayank

Année:

2017

Langue:

english

Fichier:

PDF, 390 KB

english, 2017

35

[IEEE 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Tucson, AZ, USA (2017.9.10-2017.9.14)] 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Risk assessment of cable discharge events

Stadler, Wolfgang, Niemesheim, Josef, Stadler, Andreas, Koch, Sebastian, Gossner, Harald

Année:

2017

Langue:

english

Fichier:

PDF, 1.80 MB

english, 2017

36

Identification of Soft Failure Mechanisms Triggered by ESD Stress on a Powered USB 3.0 Interface

Koch, Sebastian, Orr, Benjamin J., Gossner, Harald, Gieser, Horst A., Maurer, Linus

Journal:

IEEE Transactions on Electromagnetic Compatibility

Année:

2018

Langue:

english

Fichier:

PDF, 1.18 MB

english, 2018

37

Cisterno-lumbar gradient of complement fractions in geriatric patients with suspected normal pressure hydrocephalus

Seele, Jana, Kirschfink, Michael, Djukic, Marija, Lange, Peter, Gossner, Johannes, Bunkowski, Stephanie, Wiltfang, Jens, Nau, Roland

Journal:

Clinica Chimica Acta

Année:

2018

Langue:

english

Fichier:

PDF, 503 KB

english, 2018

38

On the cost of misperception: General results and behavioral applications

Gossner, Olivier, Steiner, Jakub

Journal:

Journal of Economic Theory

Année:

2018

Langue:

english

Fichier:

PDF, 491 KB

english, 2018

39

[IEEE 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reno, NV, USA (2018.9.23-2018.9.28)] 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Physical Insights into the ESD behavior of Drain Extended FinFETs

Sampath Kumar, B., Paul, Milova, Gossner, Harald, Shrivastava, Mayank

Année:

2018

Langue:

english

Fichier:

PDF, 702 KB

english, 2018

40

Evolutionary Foundations of Rational Choice

Gossner, Olivier, Kuzmics, Christoph

Journal:

SSRN Electronic Journal

Année:

2009

Langue:

english

Fichier:

PDF, 347 KB

english, 2009

41

Drain-Extended FinFET With Embedded SCR (DeFinFET-SCR) for High-Voltage ESD Protection and Self-Protected Designs

Paul, Milova, Sampath Kumar, B., Karmel Nagothu, Kranthi, Singhal, Pulkit, Gossner, Harald, Shrivastava, Mayank

Journal:

IEEE Transactions on Electron Devices

Année:

2019

Fichier:

PDF, 2.38 MB

2019

42

Arthropod decline in grasslands and forests is associated with landscape-level drivers

Seibold, Sebastian, Gossner, Martin M., Simons, Nadja K., Blüthgen, Nico, Müller, Jörg, Ambarlı, Didem, Ammer, Christian, Bauhus, Jürgen, Fischer, Markus, Habel, Jan C., Linsenmair, Karl Eduard, Nauss

Journal:

Année:

2019

Fichier:

PDF, 10.19 MB

2019

43

Coordination through De Bruijn sequences

Olivier Gossner, Penélope Hernández

Journal:

Operations Research Letters

Année:

2006

Langue:

english

Fichier:

PDF, 163 KB

english, 2006

44

System ESD robustness by co-design of on-chip and on-board protection measures

H. Gossner, W. Simbürger, M. Stecher

Journal:

Microelectronics Reliability

Année:

2010

Langue:

english

Fichier:

PDF, 1.15 MB

english, 2010

45

Stable generalized predictive control with constraints and bounded disturbances

J.R. Gossner, B. Kouvaritakis, J.A. Rossiter

Journal:

Année:

1997

Langue:

english

Fichier:

PDF, 1.87 MB

english, 1997

46

Device Simulation and Backside Laser Interferometry––Powerful Tools for ESD Protection Development

W. Stadler, K. Esmark, H. Gossner, M. Streibl, M. Wendel, W. Fichtner, D. Pogany, M. Litzenberger, E. Gornik

Journal:

Microelectronics Reliability

Année:

2002

Fichier:

PDF, 1.51 MB

2002

47

High abstraction level permutational ESD concept analysis

M. Streibl, F. Zängl, K. Esmark, R. Schwencker, W. Stadler, H. Gossner, S. Drüen, D. Schmitt-Landsiedel

Journal:

Microelectronics Reliability

Année:

2005

Langue:

english

Fichier:

PDF, 413 KB

english, 2005

48

Simple Bounds on the Value of a Reputation

Olivier Gossner

Journal:

Année:

2011

Langue:

english

Fichier:

PDF, 159 KB

english, 2011

49

Part II: A Novel Scheme to Optimize the Mixed-Signal Performance and Hot-carrier Reliability of Drain-Extended MOS Devices

Shrivastava, M., Baghini, M.S., Gossner, H., Rao, V.R.

Journal:

IEEE Transactions on Electron Devices

Année:

2010

Langue:

english

Fichier:

PDF, 1.05 MB

english, 2010

50

Application of cautious stable predictive control to vertical positioning in COMPASS-D tokamak

Gossner, J.R., Vyas, P., Kouvaritakis, B., Morris, A.W.

Journal:

IEEE Transactions on Control Systems Technology

Année:

1999

Langue:

english

Fichier:

PDF, 317 KB

english, 1999